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Rao, Duggi Sridhara V and Sankarasubramanian, Ramachandran and Muraleedharan, Kuttanellore and Mehrtens, Thorsten and Rosenauer, Andreas and Banerjee, Dipankar (2014) Quantitative Strain and Compositional Studies of InxGa1-xAs Epilayer in a GaAs-based pHEMT Device Structure by TEM Techniques. In: MICROSCOPY AND MICROANALYSIS, 20 (4). pp. 1262-1270.