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Kumar, Binod and Nehru, Boda and Pandey, Brajesh and Singh, Virendra and Tudu, Jaynarayan (2017) A Technique for Low Power, Stuck-at Fault Diagnosable and Reconfigurable Scan Architecture. In: IEEE East-West Design and Test Symposium (EWDTS), OCT 14-17, 2016, Yerevan, ARMENIA.
Kumar, Binod and Nehru, Boda and Pandey, Brajesh and Tudu, Jaynarayan (2017) Skip-scan: A methodology for test time reduction. In: ter Science and Automation, Indian Institute of Science, Bangalore, India, 24-27 May 2016, Guwahati, India, pp. 1-6.