Number of items: 2.
Conference Paper
Ahlawat, Satyadev and Tudu, Jaynarayan and Matrosova, Anzhela and Singh, Virendra
(2016)
A High Performance Scan Flip-Flop Design for Serial and Mixed Mode Scan Test.
In: 22nd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), JUL 04-06, 2016, Catalunya, SPAIN, pp. 233-238.
Ahlawat, Satyadev and Tudu, Jaynarayan and Matrosova, Anzhela and Singh, Virendra
(2015)
A New Scan Flip Flop Design to Eliminate Performance Penalty of Scan.
In: 24th IEEE Asian Test Symposium, NOV 22-25, 2015, Mumbai, INDIA, pp. 25-30.
This list was generated on Fri Apr 26 17:42:12 2024 IST.
