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Conference Paper

Majhi, Ananta K and Jacob, James and Patnaik, Lalit M and Agrawal, Vishwani D (1996) On Test Coverage of Path Delay Faults. In: Ninth International Conference on VLSI Design, 1996, 3-6 January, Bangalore,India, 418 -421.

Majhi, Ananta K and James, Jacob and Patnaik, Lalit M and Agrawal, Vishwani D (1995) An Efficient Automatic Test Generation System for Path Delay Faults in Combinational Circuits. In: 8th International Conference on VLSI Design, 4-7 January 1995, New Delhi, India, pp. 161-165.

Journal Article

Majhi, Ananta K and Agrawal, Vishwani D and Jacob, James and Patnaik, Lalit M (2000) Line coverage of path delay faults. In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 8 (5). pp. 610-614.

Majhi, Ananta K and Patnaik, LM and Ramanc, Srilata (1995) A Genetic Algorithm-Based Circuit Partitioner For Mcms. In: Microprocessing And Microprogramming, 41 (1). pp. 83-96.