Number of items: 2.
Journal Article
Chopade, SS and Barve, SA and Raman, KH Thulasi and Chand, N and Deo, MN and Biswas, A and Rai, Sanjay and Lodha, GS and Rao, GM and Patil, DS
(2013)
RF plasma MOCVD of Y2O3 thin films: Effect of RF self-bias on the substrates during deposition.
In: APPLIED SURFACE SCIENCE, 285
(B).
pp. 524-531.
Nayak, Maheswar and Lodha, GS and Sinha, AK and Nandedkar, RV and Shivashankar, SA
(2006)
Determination of interlayer composition at buried interfaces using soft x-ray resonant reflectivity.
In: Applied Physics Letters, 89
(18).
181920-1-3.
This list was generated on Thu Nov 21 21:17:04 2024 IST.
