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Kumar, Binod and Jindal, Ankit and Tudu, Jaynarayan and Pandey, Brajesh and Singh, Virendra (2017) Revisiting Random Access Scan for Effective hnhancement of Post-silicon Observability. In: 23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), JUL 03-05, 2017, Thessaloniki, GREECE, pp. 132-137.
