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Adiga, Raghavendra and Arpit, Gandhi and Singh, Virendra and Saluja, Kewal K and Fujiwara, Hideo and Singh, Adit D (2010) On Minimization of Test Application Time for RAS. In: 23rd International Conference on VLSI Design/9th International Conference on Embedded Systems, JAN 03-07, 2010, Bangalore, India, pp. 393-398.

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