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Ganguly, S and Chinnasamy, R and Parikh, S and Kiran, MSRN and Ramamurty, U and Bhatt, H and Deo, MN and Ghosh, S and Ghalsasi, P (2019) Understanding Structural Variations in Elastic Organic Crystals by in Situ High-Pressure Fourier Transform Infrared Spectroscopy and Nanoindentation Study. In: Crystal Growth and Design .
Mishra, Manish Kumar and Ghalsasi, Pallavi and Deo, MN and Bhatt, Himal and Poswal, Himanshu K. and Ghosh, Soumyajit and Ganguly, Somnath (2017) In situ high pressure study of an elastic crystal by FTIR spectroscopy. In: CRYSTENGCOMM, 19 (47). pp. 7083-7087.
Barve, SA and Chopade, SS and Kar, R and Chand, N and Deo, MN and Biswas, A and Patel, NN and Rao, GM and Patil, DS and Sinha, S (2017) SiOx containing diamond like carbon coatings: Effect of substrate bias during deposition. In: DIAMOND AND RELATED MATERIALS, 71 . pp. 63-72.
Chopade, SS and Nayak, C. and Bhattacharyya, D and Jha, SN and Tokas, RB and Sahoo, NK and Deo, MN and Biswas, A and Rai, Sanjay and Raman, Thulasi KH and Rao, GM and Kumar, Niranjan and Patil, DS (2015) RF plasma enhanced MOCVD of yttria stabilized zirconia thin films using octanedionate precursors and their characterization. In: APPLIED SURFACE SCIENCE, 355 . pp. 82-92.
Pandey, KK and Poswal, HK and Deo, MN and Sharma, Surinder M and Vasu, K S and Sood, A K (2014) A structural and spectroscopic investigation of reduced graphene oxide under high pressure. In: CARBON, 70 . pp. 199-206.
Chopade, SS and Barve, SA and Raman, KH Thulasi and Chand, N and Deo, MN and Biswas, A and Rai, Sanjay and Lodha, GS and Rao, GM and Patil, DS (2013) RF plasma MOCVD of Y2O3 thin films: Effect of RF self-bias on the substrates during deposition. In: APPLIED SURFACE SCIENCE, 285 (B). pp. 524-531.
