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Number of items: 3.

Journal Article

Chandra, Mohan M and Kumar, Vikram (1985) A DLTS technique for surface state capture cross-section measurement of MOS diodes. In: Applications of Surface Science, 22-23 (2). pp. 1004-1010.

Chandra, Mohan M and Prasad, Madhu and Suryan, G (1984) Metal semiconductor diodes as low temperature sensors. In: Journal of Cryogenics, 9 (4). pp. 280-283.

Kalyanaraman, V and Chandra, Mohan M and Kumar, Vikram (1983) Deep levels related to ion-implanted tellurium in silicon. In: Journal of Applied Physics, 54 (11). pp. 6417-6420.

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