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Mukhopadhyay, Chiranjit and Basu, Sanjib (2007) Bayesian Analysis of Masked Series System Lifetime Data. In: Communications in Statistics - Theory and Methods, 36 (2). pp. 329-348.
Basu, Sanjib and Basu, Asit P and Mukhopadhyay, Chiranjit (1999) Bayesian analysis for masked system failure data using non-identical Weibull models. In: Journal of Statistical Planning and Inference, 78 (1-2). pp. 255-275.
