|
 | Up a level |
Chandra, Mohan M and Kumar, Vikram (1985) A DLTS technique for surface state capture cross-section measurement of MOS diodes. In: Applications of Surface Science, 22-23 (2). pp. 1004-1010.
Kumar, TS Sampath and Hegde, MS (1985) Surface segregation and oxidation studies of Cu-Sn and Cu-Pd alloys by x-ray photoelectron and auger spectroscopy. In: Applications of Surface Science, 20 (3). pp. 290-306.
Hegde, MS and Kumar, Sampath TS and Mallya, RM (1983) A Study Of Surface Segregation And Oxidation Of Cu-Mn Alloys By X-Ray Photoelectron And Auger Spectroscopy. In: Applications of Surface Science, 17 (1). pp. 97-106.
