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Conference Paper

Goyal, M and Chaturvedi, M and Kumar, R and Vaidya, M and Shrivastava, M (2024) Load-line Dependent Current Filament Dynamics in N anoscale SCR Devices. In: IEEE International Reliability Physics Symposium, IRPS 2024, 14 April 2024through 18 April 2024, Grapevine.

Goyal, M and Chaturvedi, M and Kumar, R and Vaidya, M and Shrivastava, M (2024) Missing Trigger Circuit Action and Device Engineering for Conventional Nanoscale SCR. In: IEEE International Reliability Physics Symposium, IRPS 2024, 14 April 2024through 18 April 2024, Grapevine.

This list was generated on Wed Oct 16 15:50:26 2024 IST.