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Influence of annealing on physical properties of evaporated SnS films

Devika, M and Reddy, Koteeswara N and Ramesh, K and Gunasekhar, KR and Gopal, ESR and Reddy, Ramakrishna KT (2006) Influence of annealing on physical properties of evaporated SnS films. In: Semiconductor Science and Tehcnology, 21 (8). pp. 1125-1131.

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The effect of annealing on the composition, crystal structure, surface features and electro-optical properties of tin mono-sulfide (SnS) films, deposited by thermal evaporation at $300^\circ C$, has been studied. Elemental analysis of the films shows sulfur deficiency, which increases at higher annealing temperatures $(T_a)$. The SnS structure in the as-deposited and annealed films remains orthorhombic. With an increase in $Ta_$, the grain size and the surface roughness are reduced. The electrical resistivity also decreases with increasing $T_a$. The variation of activation energy and optical parameters with $Ta_$ has been explained by taking into account the degree of preferred orientation of the grains. The films annealed at $100^\circ C$ show some unusual features compared to those annealed at other temperatures.

Item Type: Journal Article
Publication: Semiconductor Science and Tehcnology
Publisher: Institute of Physics
Additional Information: Copyright of this article belongs to Institute of Physics
Department/Centre: Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics
Division of Physical & Mathematical Sciences > Physics
Date Deposited: 13 Oct 2006
Last Modified: 19 Sep 2010 04:32
URI: http://eprints.iisc.ac.in/id/eprint/8725

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