ePrints@IIScePrints@IISc Home | About | Browse | Latest Additions | Advanced Search | Contact | Help

Piezoelectric Bending Measurements: Noise Vs Signals

Yarajena, SS and Naik, AK (2024) Piezoelectric Bending Measurements: Noise Vs Signals. In: IEEE Transactions on Instrumentation and Measurement .

[img] PDF
IEEE_Tra_Ins_Mea_2024.pdf - Published Version
Restricted to Registered users only

Download (2MB) | Request a copy
Official URL: https://doi.org/10.1109/TIM.2024.3500064

Abstract

Many 2D and 1D emerging materials have applications as piezoelectric energy generators and as piezotronic materials for intelligent systems. Cyclic straining of the devices on flexible substrates is considered a reliable technique to quantify the direct piezoelectric property. Irrespective of their centrosymmetric nature, many 2D materials have shown promising electromechanical properties. However, the measured electrical output during bending experiments can originate from different phenomena. It is essential to know if the measured signal is the actual piezoelectric output from the sample or other attributes. The techniques used to perform experiments, the cables, and the substrate itself can generate transient responses to the applied strain that often mimic the piezoelectric response. The output signals from a single 2D material device are often low-level. Therefore, the contribution from electrostatic and triboelectric noise sources often masks the piezoelectric signals. Here, we demonstrate ways to verify the real piezoelectric response from other noise signals. We also provide insight into the polarisation direction through open-circuit voltage measurements. The current work focuses on the bending measurements of 2D material devices. However, the methods are equally applicable to other materials if the testing involves bending experiments. © 1963-2012 IEEE.

Item Type: Journal Article
Publication: IEEE Transactions on Instrumentation and Measurement
Publisher: Institute of Electrical and Electronics Engineers Inc.
Additional Information: The copyright for this article belongs to the publishers.
Keywords: Bending tests; Electrostatic devices; Flexible electronics; Liquid crystals; Open circuit voltage; Piezoelectric devices; Piezoelectric materials; Piezoelectricity, Bending experiments; Bending measurement; Cyclic straining; Emerging materials; Measurement Noise; Nanogenerators; Noise; Piezoelectric; Piezoelectric energy; Piezoelectric response, Transient analysis
Department/Centre: Division of Interdisciplinary Sciences > Centre for Nano Science and Engineering
Date Deposited: 06 Dec 2024 17:15
Last Modified: 06 Dec 2024 17:15
URI: http://eprints.iisc.ac.in/id/eprint/87104

Actions (login required)

View Item View Item