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Nonlinear Electrical Transport Unveils Fermi Surface Malleability in a Moiré Heterostructure

Datta, S and Bhowmik, S and Varshney, H and Watanabe, K and Taniguchi, T and Agarwal, A and Chandni, U (2024) Nonlinear Electrical Transport Unveils Fermi Surface Malleability in a Moiré Heterostructure. In: Nano Letters .

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Official URL: https://doi.org/10.1021/acs.nanolett.4c01946

Abstract

Van Hove singularities enhance many-body interactions and induce collective states of matter ranging from superconductivity to magnetism. In magic-angle twisted bilayer graphene, van Hove singularities appear at low energies and are malleable with density, leading to a sequence of Lifshitz transitions and resets observable in Hall measurements. However, without a magnetic field, linear transport measurements have limited sensitivity to the band�s topology. Here, we utilize nonlinear longitudinal and transverse transport measurements to probe these unique features in twisted bilayer graphene at zero magnetic field. We demonstrate that the nonlinear responses, induced by the Berry curvature dipole and extrinsic scattering processes, intricately map the Fermi surface reconstructions at various fillings. Importantly, our experiments highlight the intrinsic connection of these features with the moiré bands. Beyond corroborating the insights from linear Hall measurements, our findings establish nonlinear transport as a pivotal tool for probing band topology and correlated phenomena. © 2024 American Chemical Society.

Item Type: Journal Article
Publication: Nano Letters
Publisher: American Chemical Society
Additional Information: The copyright for this article belongs to the publishers.
Keywords: Fermi surface; Fruits; Graphene; Magnetic fields; Surface scattering; Topology, Asymmetric scattering; Berry curvature dipole; Bilayer Graphene; Fermi surface reconstruction; Hall measurements; Nonlinear transport; Surfaces reconstruction; Twisted bilayer graphene; Twisted bilayers; Van Hove singularities, Surface reconstruction
Department/Centre: Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics
Date Deposited: 18 Oct 2024 11:58
Last Modified: 18 Oct 2024 11:58
URI: http://eprints.iisc.ac.in/id/eprint/86410

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