Comparison of Surrogate Modeling Approaches for Estimation of EMI Filter Insertion Loss

Shukla, A and Nukala, SS and Akash, . and Singh, DK and Gope, D and Hansen, J (2023) Comparison of Surrogate Modeling Approaches for Estimation of EMI Filter Insertion Loss. In: 2023 IEEE Electrical Design of Advanced Packaging and Systems, EDAPS 2023, 12 December 2023 through 14 December 2023, Hybrid, Rose-Hill.

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Abstract

The increasing application of silicon carbide and gallium nitride transistors decreases the size of power electronic systems because of faster switching and clock times. However, both increase the electromagnetic emission, causing additional cost for the design of EMI filters. Finding a joint optimum requires long computation time. Meta modeling techniques reduce the computation time by approximating physical models with a simple mathematical equivalent function, generated from training data. If the physical models are computationally expensive, it is important to identify particularly efficient methods. We compare the surrogate modeling techniques of Kriging, Polynomial Chaos Expansion, Polynomial Chaos Kriging and Wideband Kriging. We find that Wideband Kriging is most accurate, but also has the most excessive model generation time. © 2023 IEEE.

Item Type:	Conference Paper
Publication:	IEEE Electrical Design of Advanced Packaging and Systems Symposium
Publisher:	Institute of Electrical and Electronics Engineers Inc.
Additional Information:	The copyright for this article belongs to Institute of Electrical and Electronics Engineers Inc.
Keywords:	Gallium nitride; III-V semiconductors; Polynomials; Silicon carbide, EMI filters; EMI/EMC; Kriging; Meta model; Metamodeling; Polynomial chaos; Polynomial chaos kriging; Surrogate modeling; Wide-band; Wideband kriging, Kriging
Department/Centre:	Division of Electrical Sciences > Electrical Communication Engineering
Date Deposited:	04 Sep 2024 05:58
Last Modified:	04 Sep 2024 05:58
URI:	http://eprints.iisc.ac.in/id/eprint/84982

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