Leng, P and Joseph, NB and Cao, X and Qian, Y and Li, Z and Ma, Q and Ai, L and Banerjee, A and Zhang, Y and Jia, Z and Zhang, Y and Xi, C and Pi, L and Narayan, A and Zhang, J and Xiu, F (2023) Thickness-Dependent Magnetic Breakdown in ZrSiSe Nanoplates. In: Nano Letters, 24 (17). 5125 - 5131.
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Abstract
We report a study of thickness-dependent interband and intraband magnetic breakdown by thermoelectric quantum oscillations in ZrSiSe nanoplates. Under high magnetic fields of up to 30 T, quantum oscillations arising from degenerated hole pockets were observed in thick ZrSiSe nanoplates. However, when decreasing the thickness, plentiful multifrequency quantum oscillations originating from hole and electron pockets are captured. These multiple frequencies can be explained by the emergent interband magnetic breakdown enclosing individual hole and electron pockets and intraband magnetic breakdown within spin-orbit coupling (SOC) induced saddle-shaped electron pockets, resulting in the enhanced contribution to thermal transport in thin ZrSiSe nanoplates. These experimental frequencies agree well with theoretical calculations of the intriguing tunneling processes. Our results introduce a new member of magnetic breakdown to the field and open up a dimension for modulating magnetic breakdown, which holds fundamental significance for both low-dimensional topological materials and the physics of magnetic breakdown. © 2024 American Chemical Society.
Item Type: | Journal Article |
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Publication: | Nano Letters |
Publisher: | American Chemical Society |
Additional Information: | The copyright for this article belongs to American Chemical Society. |
Keywords: | Nanostructures; Selenium compounds; Zirconium compounds, Hole and electron pockets; Interband; Magnetic breakdown; Mangetic breakdown; Nanoplates; Nodal line; Nodal-line semimetal; Quantum oscillations; Thermoelectric; Thermoelectric measurements, Silicon compounds |
Department/Centre: | Division of Chemical Sciences > Solid State & Structural Chemistry Unit |
Date Deposited: | 02 Sep 2024 06:49 |
Last Modified: | 02 Sep 2024 06:49 |
URI: | http://eprints.iisc.ac.in/id/eprint/84941 |
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