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Diode-PUF for Intelligent Electronic Devices

Jadhav, VD and Kalloor, R and Poola, L and Prabhakar, TV (2024) Diode-PUF for Intelligent Electronic Devices. In: UNSPECIFIED, pp. 330-332.

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Official URL: https://doi.org/10.1109/COMSNETS59351.2024.1042716...


Physically unclonable function (PUF) can be generated from unique physical variations occurring naturally during semiconductor manufacturing. These signatures can be extracted from individual electronic components and combined in different ways to generate a large unique identifier for an electronic device such as the Intelligent Electronic Device (IED). PUFs can inherently be used for applications such as authentication, key generation, tracing, anti-counterfeiting, identification etc. In this work, we demonstrate our PUF signature extracted from diodes present in the output ports of the IED. We exploit the cut-in voltage region variations across the diodes to demonstrate the properties of the PUF. Uniqueness of the signatures are further enhanced by compensating for temperature variations and combating the lead wire losses. © 2024 IEEE.

Item Type: Conference Paper
Publication: 2024 16th International Conference on COMmunication Systems and NETworkS, COMSNETS 2024
Publisher: Institute of Electrical and Electronics Engineers Inc.
Additional Information: The copyright for this article belongs to Institute of Electrical and Electronics Engineers Inc.
Department/Centre: Division of Electrical Sciences > Electronic Systems Engineering (Formerly Centre for Electronic Design & Technology)
Date Deposited: 14 May 2024 11:36
Last Modified: 14 May 2024 11:36
URI: https://eprints.iisc.ac.in/id/eprint/84446

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