Ghosh, M and Samal, D and Kumar, PSA (2023) Spontaneous Hall effect in the magnetic Weyl semimetallic Eu2Ir2O7 (111) thin films. In: Applied Physics Letters, 123 (21).
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Abstract
Here, we have carried out a low-temperature magnetization and magnetotransport study on epitaxial antiferromagnetic Eu2Ir2O7 (111) thin films with an all-in-all-out/all-out-all-in spin structure to delve into the possibility of realizing spontaneous Hall effect that can provide strong experimental evidence for the existence of the Weyl semimetallic phase. The temperature-dependent resistivity on Eu2Ir2O7 (111) thin films indicates a semimetallic transition below 90 K and the existence of a correlated metallic state in the high-temperature regime (90-300 K). Magnetoresistance measurements suggest that at a low temperature (below 10 K), the all-in-all-out (AIAO) spin structure is stable enough against the applied magnetic field, whereas above 10 K, application of magnetic field causes field-induced modification of the spin structure and plastic domain deformation. Hall resistivity shows a spontaneous Hall effect (SHE) in the low-temperature semimetallic phase of Eu2Ir2O7 (111) thin films with minimal magnetization (AIAO/all-out-all-in spin structure). The observed SHE provides strong evidence for the emergent Weyl semimetallic phase in the (111) thin film geometry of antiferromagnetic Eu2Ir2O7 © 2023 Author(s).
Item Type: | Journal Article |
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Publication: | Applied Physics Letters |
Publisher: | American Institute of Physics Inc. |
Additional Information: | The copyright for this article belongs to American Institute of Physics Inc. |
Keywords: | Antiferromagnetism; Europium compounds; Iridium compounds; Magnetization; Thin films, Antiferromagnetics; Experimental evidence; High-temperature regime; Low-temperature magnetization; Lows-temperatures; Metallic state; Semimetallics; Spin structures; Temperature-dependent resistivity; Thin-films, Temperature |
Department/Centre: | Division of Physical & Mathematical Sciences > Physics |
Date Deposited: | 29 Feb 2024 06:07 |
Last Modified: | 29 Feb 2024 06:07 |
URI: | https://eprints.iisc.ac.in/id/eprint/83738 |
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