The transition from soft to hard exchange bias and oscillation of biasing field with the variation of IrMn thickness

Joy, A and Kayal, S and Anil Kumar, PS (2023) The transition from soft to hard exchange bias and oscillation of biasing field with the variation of IrMn thickness. In: EEE International Magnetic Conference - Short Papers, INTERMAG Short Papers, 15-19 May 2023, Sendai, Japan.

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Abstract

The exchange bias (EB) in thin films with compensated AFM-FM interfaces is explained at the microscopic level with the support of experimental results. In the article, we varied the thickness of IrMn deposited above Co and have observed that, for small thickness the system has shown soft EB and as the thickness increases the EB has shown oscillation nature. As the thickness increases, the soft EB has transformed into hard EB. Also for the AFM deposited below the FM layer, the soft EB has enhanced by 5 times (20 Oe to 100 Oe). © 2023 IEEE.

Item Type:	Conference Paper
Publication:	2023 IEEE International Magnetic Conference - Short Papers, INTERMAG Short Papers 2023 - Proceedings
Publisher:	Institute of Electrical and Electronics Engineers Inc.
Additional Information:	The copyright for this article belongs to The Institute of Electrical and Electronics Engineers Inc.
Keywords:	Binary alloys; Iridium alloys, AFM; Antiferromagnetic pinning; Antiferromagnetics; Coercivity enhancement; Controled coercivity enhancement; Exchange bias; Exchange bias oscillation; Hard and soft exchange bias; Proximity effects, Manganese alloys
Department/Centre:	Division of Physical & Mathematical Sciences > Physics
Date Deposited:	21 Dec 2023 04:19
Last Modified:	21 Dec 2023 04:19
URI:	https://eprints.iisc.ac.in/id/eprint/83535

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