Similar Class Style Augmentation for Efficient Cross-Domain Few-Shot Learning

Sreenivas, M and Biswas, S (2023) Similar Class Style Augmentation for Efficient Cross-Domain Few-Shot Learning. In: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2023, 18 - 22 June 2023, Vancouver, BC, Canada, pp. 4590-4598.

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Abstract

Cross-Domain Few-Shot Learning (CD-FSL) aims to recognize new classes from unseen domains, given limited training samples. Majority of the state-of-the-art approaches for this task introduce new task-specific additional parameters for adapting to the novel task, which involves changing the trained model architecture, in addition to increasing the number of model parameters. The first contribution of this work is to revisit the existing approaches like modifying the Batch Normalization affine parameters and the scale hyperparameter in cosine similarity based softmax loss for adapting the trained model to the new tasks, without changing the model architecture. Secondly, to aid the model learning with few examples per class, we propose to augment the data of each class with the styles of the semantically similar classes. Extensive evaluation on the challenging Meta-Dataset shows that this simple framework is very effective for the CD-FSL task. We also show that the Similar-class Style Augmentation module can be seamlessly integrated with existing approaches to further improve their performance, thus establishing the state-of-the-art in this challenging area. © 2023 IEEE.

Item Type:	Conference Paper
Publication:	IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
Publisher:	IEEE Computer Society
Additional Information:	The copyright for this article belongs to the IEEE Computer Society.
Keywords:	Affine parameters; Cosine similarity; Cross-domain; Hyper-parameter; Modeling architecture; Modeling parameters; Normalisation; Novel task; State-of-the-art approach; Training sample, Computer vision
Department/Centre:	Division of Electrical Sciences > Electrical Engineering
Date Deposited:	24 Nov 2023 10:34
Last Modified:	24 Nov 2023 10:34
URI:	https://eprints.iisc.ac.in/id/eprint/83214

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