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Effect of anisotropy on dislocations at $YBa_2Cu_30_{7-x}-PrBa_2Cu_30_{7-x}$ epitaxial interfaces

Selvan, Arul K and Biswas, SK (1994) Effect of anisotropy on dislocations at $YBa_2Cu_30_{7-x}-PrBa_2Cu_30_{7-x}$ epitaxial interfaces. In: Superconductor Science & Technology, 7 (11). pp. 805-811.

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The defect structure in the multilayer $YBa_2Cu_30_{7-1}$ (YSCO) with other materials is crucial to the pertormance of devices involving YBCO. Snce the growth sulface morphology during tne deposition process of these films translates into the interface structure of the device, an understanding of the early stage of growth is necessary. Anisotropic elast'c:ty is used here to map the stress fields in the vsco system when it acts as an underlayer for various surface tract:ons that arise due to the interfacial mismatches introduced by the deposition of a $PrBa_2Cu_30_{7-x}$ (PSCO) film on this underlayer. The implications of the stress distribution for the dislocation glide in the YBCO layer are discussed.

Item Type: Journal Article
Publication: Superconductor Science & Technology
Publisher: IOP
Additional Information: Copyright for this article belongs to Institute of Physics.
Department/Centre: Division of Mechanical Sciences > Mechanical Engineering
Date Deposited: 10 Jan 2007
Last Modified: 19 Sep 2010 04:30
URI: http://eprints.iisc.ac.in/id/eprint/8235

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