Monishmurali, M and Kranthi, NK and Boselli, G and Shrivastava, M (2023) Impact of Thin-oxide Gate on the On-Resistance of HV-PNP Under ESD Stress. In: 61st IEEE International Reliability Physics Symposium, IRPS 2023, 26-30 March 2023, Monterey.
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Abstract
Physical insights into the impact of the thin-oxide polysilicon gate on the on-resistance of DeMOS-based HV-PNP are developed using detailed TCAD simulation. Turn-on and eventual failure mechanisms in HV-PNP are discussed. The impact of thin-oxide polysilicon placed over the N-Well and P-Well regions is investigated separately. The physics of regenerative bipolar degradation and its effect of dynamic on-resistance is understood as a function of thin-oxide placement. Furthermore, floating the thin-oxide gate mitigated regenerative bipolar degradation while having a faster lateral PNP trigger, resulting in the best case of on-resistance at all current levels. The insights developed in this work help to design compact high-voltage PNPs. © 2023 IEEE.
Item Type: | Conference Paper |
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Publication: | IEEE International Reliability Physics Symposium Proceedings |
Publisher: | Institute of Electrical and Electronics Engineers Inc. |
Additional Information: | The copyright for this article belongs to the Institute of Electrical and Electronics Engineers Inc. |
Keywords: | ESD; Gate Field Effect; High Voltage PNP; On Resistance |
Department/Centre: | Division of Electrical Sciences > Electronic Systems Engineering (Formerly Centre for Electronic Design & Technology) |
Date Deposited: | 07 Jul 2023 06:35 |
Last Modified: | 07 Jul 2023 06:35 |
URI: | https://eprints.iisc.ac.in/id/eprint/82108 |
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