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Lessons from hafnium dioxide-based ferroelectrics

Noheda, B and Nukala, P and Acuautla, M (2023) Lessons from hafnium dioxide-based ferroelectrics. In: Nature Materials, 22 (5). pp. 562-569.

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Official URL: https://doi.org/10.1038/s41563-023-01507-2


A bit more than a decade after the first report of ferroelectric switching in hafnium dioxide-based ultrathin layers, this family of materials continues to elicit interest. There is ample consensus that the observed switching does not obey the same mechanisms present in most other ferroelectrics, but its exact nature is still under debate. Next to this fundamental relevance, a large research effort is dedicated to optimizing the use of this extraordinary material, which already shows direct integrability in current semiconductor chips and potential for scalability to the smallest node architectures, in smaller and more reliable devices. Here we present a perspective on how, despite our incomplete understanding and remaining device endurance issues, the lessons learned from hafnium dioxide-based ferroelectrics offer interesting avenues beyond ferroelectric random-access memories and field-effect transistors. We hope that research along these other directions will stimulate discoveries that, in turn, will mitigate some of the current issues. Extending the scope of available systems will eventually enable the way to low-power electronics, self-powered devices and energy-efficient information processing.

Item Type: Journal Article
Publication: Nature Materials
Publisher: Nature Research
Additional Information: The copyright for this article belongs to Nature Research.
Keywords: Energy efficiency; Ferroelectricity; Field effect transistors; Hafnium oxides, 'current; Ferroelectric random access memory; Ferroelectric switching; Field-effect transistor; Integrability; Memory effects; Node architectures; Research efforts; Semiconductor chips; Ultrathin layers, Ferroelectric materials
Department/Centre: Division of Interdisciplinary Sciences > Centre for Nano Science and Engineering
Date Deposited: 15 Jun 2023 07:54
Last Modified: 15 Jun 2023 07:54
URI: https://eprints.iisc.ac.in/id/eprint/81949

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