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Electronically Tunable Circuit Realization of Multimemelement Function Simulator and Its Application to Chaos Generation

Bhardwaj, K and Raj, N and Srivastava, M (2023) Electronically Tunable Circuit Realization of Multimemelement Function Simulator and Its Application to Chaos Generation. In: International Journal of Bifurcation and Chaos, 33 (3).

Full text not available from this repository.
Official URL: https://doi.org/10.1142/S021812742350030X

Abstract

The paper presents a very compact dual memelement function simulator using only one active building block (ABB) namely modified Voltage Differencing Current Conveyor (mVDCC), two MOSFETs, and two grounded passive elements. The proposed emulator can realize the function of memristor, meminductor, and memcapacitor-dual, which can be achieved via the proper selection of only one grounded passive element as R, L, and C. The proposed multimemelement emulator (MME) is fully electronically tunable and exhibits nonvolatile storage property. Also, the emulator can exhibit memristor response up to MHz range of frequency. The PSPICE-generated simulation results verify the working of the given floating MME for the realization of all three elements using 0.18 μm CMOS technology node. The presented CMOS layout shows that the proposed emulator implementation occupies an area of 66.27 μm ∗ 40 μm. Along with the CMOS-based structure, the presented MME is verified through commercial ICs-based implementation. The given application example of the chaotic circuit also proves the working of the presented MME

Item Type: Journal Article
Publication: International Journal of Bifurcation and Chaos
Publisher: World Scientific
Additional Information: The copyright for this article belongs to World Scientific.
Keywords: CMOS integrated circuits; Electric grounding; Nonvolatile storage; SPICE; Timing circuits, Chaos generation; Chaotic circuits; Circuit realization; Electronically tunable; ITS applications; Memelement; Memristor; Passive elements; Tunable circuits; VDCC, Memristors
Department/Centre: Division of Electrical Sciences > Electronic Systems Engineering (Formerly Centre for Electronic Design & Technology)
Date Deposited: 21 Apr 2023 10:36
Last Modified: 21 Apr 2023 10:36
URI: https://eprints.iisc.ac.in/id/eprint/81374

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