Swaminathan, J (2022) The emergence of analytical techniques for defects in metal oxide. [Book Chapter]
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Defects in material govern its geometric and electronic properties. Hence, understanding the defects is a foundation for material science development. As emerging analytical techniques aid in the constant revision of our material perspectives, the purpose of this invited chapter is to offer a brief overview of the techniques that can be used to analyze defects in metal oxides. Especially, it focuses on principles and applications associated with defect-based characterization tools like high-resolution transmission electron microscopy positron annihilation spectroscopy X-ray absorption near edge spectroscopy, extended X-ray absorption fine structure, X-ray diffraction, X-ray photoelectron spectroscopy, electron paramagnetic resonance spectroscopy, scanning tunneling microscopy, and optical absorption/emission studies. Also in this chapter, we outline the range of information that can be acquired using these techniques with examples. These techniques not only help us to understand the isolated point defects but also aggregate complex defect centers in metal oxides and eventually give an overall picture of the nonstoichiometric compounds. Finally, this chapter summarizes the possible limitations of these techniques. © 2023 Elsevier Inc. All rights reserved.
| Item Type: | Book Chapter |
|---|---|
| Publication: | Metal Oxide Defects: Fundamentals, Design, Development and Applications |
| Publisher: | Elsevier |
| Additional Information: | The copyright for this article belongs to Elsevier. |
| Keywords: | Defects; Metal oxides; STM; XANES; XPS; XRD |
| Department/Centre: | Division of Chemical Sciences > Inorganic & Physical Chemistry |
| Date Deposited: | 28 Mar 2023 07:05 |
| Last Modified: | 28 Mar 2023 07:05 |
| URI: | https://eprints.iisc.ac.in/id/eprint/81193 |
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