ePrints@IIScePrints@IISc Home | About | Browse | Latest Additions | Advanced Search | Contact | Help

Resistance fluctuation spectroscopy of phase transitions in (La 0.2 Pr 0.2 Nd 0.2 Sm 0.2 Eu 0.2)NiO3thin films

Nagarajan, R and Patel, RK and Bid, A (2023) Resistance fluctuation spectroscopy of phase transitions in (La 0.2 Pr 0.2 Nd 0.2 Sm 0.2 Eu 0.2)NiO3thin films. In: Applied Physics Letters, 122 (10).

[img]
Preview
PDF
app_phy_let_122-10_2023.pdf - Published Version

Download (8MB) | Preview
Official URL: https://doi.org/10.1063/5.0139995

Abstract

The study of phase transitions is crucial to understanding the physics of materials and utilizing them for technological applications. This article presents a detailed analysis of the electronic transport properties of high entropy oxide thin films. We observe an increase in resistance fluctuations across a first-order phase transition. We show that the noise arises from an electronic phase separation accompanying the spin ordering due to the formation of domains of localized and delocalized charges. We conclude that due to charge disproportionation, the charge carriers form domains of localized and delocalized electrons in this system. Our study establishes the existence of multiple states with near equal energy in such complex oxide thin films. © 2023 Author(s).

Item Type: Journal Article
Publication: Applied Physics Letters
Publisher: American Institute of Physics Inc.
Additional Information: The copyright for this article belongs to the Authors.
Keywords: Neodymium; Oxide films; Thin films, Electronic phase separation; Electronic transport properties; First-order phase transitions; Fluctuation spectroscopy; Localised; Oxide thin films; Resistance fluctuation; Spin order; Technological applications; Thin-films, Phase separation
Department/Centre: Division of Physical & Mathematical Sciences > Physics
Date Deposited: 05 Apr 2023 06:15
Last Modified: 05 Apr 2023 06:15
URI: https://eprints.iisc.ac.in/id/eprint/81156

Actions (login required)

View Item View Item