Babu, NC and Kannan, V and Soundararajan, R (2023) No Reference Opinion Unaware Quality Assessment of Authentically Distorted Images. In: 23rd IEEE/CVF Winter Conference on Applications of Computer Vision, WACV 2023, 3 - 7 January 2023, Waikoloa, pp. 2458-2467.
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Abstract
The quality assessment (QA) of camera captured authentically distorted images is important on account of its ubiquitous applications and challenging due to the lack of a reference. While there exists a plethora of supervised no reference (NR) image QA (IQA) algorithms, there is a need to study unsupervised or opinion unaware algorithms on account of their superior generalization performance. We explore self-supervised learning (SSL) for the feature design on authentically distorted images to predict quality without training on human labels. While SSL on synthetic distortions has recently shown promise, there is a need to enrich the feature learning on authentic distortions. The key challenge in achieving this is in the learning of quality sensitive features with mitigated content dependence. We design a self-supervised contrastive learning approach which only requires positives and introduce a content separation loss by estimating a bound on the mutual information between the features learnt and the content information. We show on multiple authentically distorted datasets that our self-supervised features can predict image quality by comparing with a corpus of pristine images and achieve state-of-the-art performance.§ © 2023 IEEE.
Item Type: | Conference Paper |
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Publication: | Proceedings - 2023 IEEE Winter Conference on Applications of Computer Vision, WACV 2023 |
Publisher: | Institute of Electrical and Electronics Engineers Inc. |
Additional Information: | The copyright for this article belongs to Institute of Electrical and Electronics Engineers Inc. |
Keywords: | Computer vision, Algorithm: low-level and physic-based vision; And algorithm (including transfer, low-shot, semi-, self-, and un-supervised learning); Distorted images; Formulation; Learning architectures; Machine learning architecture; Machine-learning; Physics based vision; Quality assessment; Un-supervised learning, Supervised learning |
Department/Centre: | Division of Electrical Sciences > Electrical Communication Engineering |
Date Deposited: | 15 Mar 2023 06:06 |
Last Modified: | 15 Mar 2023 06:06 |
URI: | https://eprints.iisc.ac.in/id/eprint/80990 |
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