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Investigation on Temperature Dependent Inductance (TDI) of a planar Multi-Layer Inductor (MLI) down to 4.2 K

Sagar, P and Hassan, HK and Lakshmi, EDA and Akber, K and Girish, PS and Gour, AS and Karunanithi, R (2020) Investigation on Temperature Dependent Inductance (TDI) of a planar Multi-Layer Inductor (MLI) down to 4.2 K. In: Review of Scientific Instruments, 91 (8).

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Official URL: https://doi.org/10.1063/5.0008901


This paper presents an investigation of the temperature dependence characteristics specific to cryogenic planar Multi-Layer Inductors (MLIs). This paper establishes that the inductance of a planar MLI at a specific frequency varies with temperature when the sensor is cooled down to 4.2 K while providing a detailed analysis of various possible factors that might contribute to the variation in the sensor performance, such as the thermal deformation and the variation in the properties of sensor materials, using a combination of experiments and simulations. By calculating the interlayer capacitance, we have attempted to adopt a novel approach in the investigation of the effects of thermal deformation on the sensor. In order to arrive at that, the relative permittivity of the base material (G10CR-FR4) at cryogenic temperatures was obtained through experiments. The ANSYS static structural package was used for modeling thermally induced deformations, after which the deformed capacitance and inductance were obtained using Ansoft MAXWELL. From the analysis, we have concluded that the variation in the inductance of the sensor has a direct correlation with the electrical resistivity (hence the residual resistivity ratio) of the coil material. The number of inductor layers and the area of the component layer will also determine the temperature dependence phenomenon. These conclusions are not obvious from the established inductance models.

Item Type: Journal Article
Publication: Review of Scientific Instruments
Publisher: American Institute of Physics Inc.
Additional Information: The copyright for this article belongs to American Institute of Physics Inc.
Keywords: Capacitance; Cryogenics; Deformation; Inductance; Temperature distribution, Cryogenic temperatures; Multilayer inductor; Relative permittivity; Residual resistivity ratios; Specific frequencies; Temperature dependence; Temperature dependent; Thermally induced deformations, Electric inductors
Department/Centre: Division of Physical & Mathematical Sciences > Centre for Cryogenic Technology
Date Deposited: 16 Feb 2023 03:29
Last Modified: 16 Feb 2023 03:29
URI: https://eprints.iisc.ac.in/id/eprint/80272

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