Quality of Control Assessment for Tactile Cyber-Physical Systems

Polachan, K and Prabhakar, TV and Singh, C and Panchapakesan, D (2019) Quality of Control Assessment for Tactile Cyber-Physical Systems. In: 16th Annual IEEE International Conference on Sensing, Communication, 10 June 2019 - 13 June 2019, Boston.

PDF SECON_2019.pdf - Published Version Restricted to Registered users only Download (1MB) | Request a copy

Abstract

In this paper, we evolve a methodology and define a metric to evaluate Tactile Cyber-Physical Systems (TCPS). Towards this goal, we adopt the step response analysis, a well-known control theoretic method. The adoption includes replacing the human operator (or master) with a controller with known characteristics and analyzing its response to slave side haptic sensor step changes. The resulting step response curves demonstrate that the Quality of Control (QoC) metric is sensitive to control loop instabilities and serves as a good indicator of cybersickness experienced by human operators. We demonstrate the efficacy of the proposed methodology and metric through experiments on a TCPS testbed. The experiments include assessing the suitability of several access technologies, intercontinental links and testbed configurations. © 2019 IEEE.

Item Type:	Conference Paper
Publication:	Annual IEEE Communications Society Conference on Sensor, Mesh and Ad Hoc Communications and Networks workshops
Publisher:	IEEE Computer Society
Additional Information:	The copyright for this article belongs to IEEE Computer Society
Keywords:	Cyber Physical System; Embedded systems; Step response; Testbeds, Access technology; Control loop; Cybersickness; Haptic sensors; Human operator; Quality of controls; Response analysis; Response curves, Quality control
Department/Centre:	Division of Electrical Sciences > Electronic Systems Engineering (Formerly Centre for Electronic Design & Technology) Others
Date Deposited:	23 Dec 2022 06:41
Last Modified:	23 Dec 2022 06:41
URI:	https://eprints.iisc.ac.in/id/eprint/78530

Actions (login required)

View Item