Black-Box Behavioral DC-DC Converter IC Emission Model

Rao, SR and Ishibashi, N and Nayak, B and Muniganti, H and Ambasana, N and Sahu, V and Gope, D and Devi, A (2022) Black-Box Behavioral DC-DC Converter IC Emission Model. In: 2022 IEEE International Symposium on Electromagnetic Compatibility and Signal/Power Integrity, EMCSI 2022, 1 - 5 August 2022, Spokane, pp. 570-574.

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Abstract

Electrified, automated, connected, and shared mobility trends have led to stringent EMC requirements for in-vehicle equipment. In addition to noise countermeasure technology, it is becoming important to predict EMC risk from the early design stage. Simulation is an effective method to analyze and monitor EMI/EMC performance such that possible upstream problems can be addressed cost-effectively. A primary challenge towards such a simulation methodology is the non-availability of models for Integrated Circuits (ICs) which are the sources of noise. In this work, an operating condition-dependent behavioral model for ICs is developed using measured data on a specially designed test-PCB followed by training a machine-learning network. This is combined with an electromagnetic simulation framework to generate system-level EMC results. The proposed model-based simulation methodology is validated with measurements for a DC-DC converter system.

Item Type:	Conference Paper
Publication:	2022 IEEE International Symposium on Electromagnetic Compatibility and Signal/Power Integrity, EMCSI 2022
Publisher:	Institute of Electrical and Electronics Engineers Inc.
Additional Information:	The copyright for this article belongs to Institute of Electrical and Electronics Engineers Inc.
Keywords:	DC-DC converters; Electromagnetic simulation; Integrated circuits; Timing circuits, Conducted emission; Conducted emissions; ICEM-conducted emission; ICEM-radiated emission; IEC-62433-2; Integrated circuit modeling; Radiated emission; Radiated emissions, Electromagnetic compatibility
Department/Centre:	Division of Electrical Sciences > Electrical Communication Engineering
Date Deposited:	17 Nov 2022 05:10
Last Modified:	17 Nov 2022 05:10
URI:	https://eprints.iisc.ac.in/id/eprint/77917

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