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Probing atomic level interactions in Ni nanorods and AFM cantilever using atomic force microscopy based F–D spectroscopy

Dutta, S and Singh, MK and Bobji, MS (2018) Probing atomic level interactions in Ni nanorods and AFM cantilever using atomic force microscopy based F–D spectroscopy. In: 9th International Scientific Conference, BALTTRIB 2017, 16 - 17 November 2017, Kaunas, pp. 194-198.

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Official URL: https://doi.org/10.15544/balttrib.2017.34

Abstract

Atomic force microscopy based force-displacement spectroscopy is used to quantify magnetic interaction force between sample and magnetic cantilever. AFM based F–D spectroscopy is used widely to understand various surface-surface interaction at small scale. Here we have studied the interaction between a magnetic nanocomposite and AFM cantilevers. Two different AFM cantilever with same stiffness but with and without magnetic coating is used to obtain F–D spectra in AFM. The composite used has magnetic Ni nanophase distributed uniformly in an Alumina matrix. Retrace curves obtained using both the cantilevers on magnetic composite and sapphire substrate are compared. It is found for magnetic sample cantilever comes out of contact after traveling 100 nm distance from the actual point of contact. We have also used MFM imaging at various lift height and found that beyond 100nm lift height magnetic contrast is lost for our composite sample, which further confirms our F–D observation.

Item Type: Conference Paper
Publication: Proceedings of 9th International Scientific Conference, BALTTRIB 2017 - Dedicated to 100th Anniversary of Restitution of Lithuania
Publisher: Aleksandras Stulginskis University
Additional Information: The copyright for this article belongs to the Authors.
Keywords: Alumina; Aluminum oxide; Magnetism; Nanocantilevers; Nanocomposites; Nanorods; Sapphire; Synthetic metals, Atomic-level interactions; Force displacement; Magnetic composites; Magnetic interactions; Magnetic nanocomposites; Nano-porous; Sapphire substrates; Surface interactions, Atomic force microscopy
Department/Centre: Division of Mechanical Sciences > Mechanical Engineering
Date Deposited: 01 Sep 2022 10:15
Last Modified: 01 Sep 2022 10:15
URI: https://eprints.iisc.ac.in/id/eprint/76333

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