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Vis-Near-Infrared Photodetectors Based on Methyl Ammonium Lead Iodide Thin Films by Pulsed Laser Deposition

Patel, N and Dias, S and Krupanidhi, SB (2018) Vis-Near-Infrared Photodetectors Based on Methyl Ammonium Lead Iodide Thin Films by Pulsed Laser Deposition. In: Journal of Electronic Materials, 47 (4). pp. 2306-2315.

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Official URL: https://doi.org/10.1007/s11664-017-6039-y

Abstract

Organic–inorganic hybrid perovskite materials are considered as promising candidates for emerging thin-film photodetectors. In this work, we discuss the application of the CH3NH3PbI3 thin films by pulsed laser deposition for photodetection applications. With this method, we obtained good perovskite film coverage on fluorine-doped tin oxide-coated substrates and observed wel- developed grains. The films showed no sign of degradation over several months of testing. We investigated the surface morphology and surface roughness of the films by field emission scanning electron microscopy and atomic force microscopy. The optical response of the films was studied using ultraviolet–visible and photoluminescence spectroscopy. We carried out a study on the solar and infrared photodetection of CH3NH3PbI3 thin films. The values of the responsivity, sensitivity, external quantum efficiency and specific detectivity under 1 sun illumination and 0.7 V bias were 105.4 A/W, 1.9, 2.38 × 104% and 1.5 × 1012 Jones, respectively.

Item Type: Journal Article
Publication: Journal of Electronic Materials
Publisher: Springer New York LLC
Additional Information: The copyright for this article belongs to the Springer New York LLC.
Keywords: Ammonium iodide; Atomic force microscopy; Deposition; Field emission microscopes; Hybrid materials; Infrared devices; Infrared radiation; Iodine compounds; Lead compounds; Nanocomposites; Perovskite; Perovskite solar cells; Photodetectors; Photoluminescence spectroscopy; Photons; Pulsed laser deposition; Pulsed lasers; Scanning electron microscopy; Surface roughness; Tin oxides, CH3NH3PbI3; External quantum efficiency; Field emission scanning electron microscopy; Fluorine doped tin oxide; Near infrared photodetectors; Photo detection; solar; Thin film photodetectors, Thin films
Department/Centre: Division of Chemical Sciences > Materials Research Centre
Date Deposited: 08 Aug 2022 08:52
Last Modified: 08 Aug 2022 08:52
URI: https://eprints.iisc.ac.in/id/eprint/75603

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