Significance of reactive power loss and its application to system voltage stability

Moger, T and Johnson, T and Dhadbanjan, T (2018) Significance of reactive power loss and its application to system voltage stability. In: 2018 IEEMA Engineer Infinite Conference, eTechNxT 2018, 13 - 14 March 2018, New Delhi, pp. 1-6.

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Abstract

In this paper, the significance of reactive power loss and its application to system voltage stability is presented. The reactive power loss allocation at the load-buses is computed from the reactive power support and loss allocation algorithm using modified Y-bus approach. Further, it is computed for the various load conditions in the system upto the maximum loadability point. The proposed approach is illustrated on a sample 5-bus system and also tested on a 11-bus practical equivalent system of Indian southern region power grid. A comparative analysis is also carried out with the continuation power flow method to highlight the features of the proposed approach. It can be observed from the simulation results that the reactive power loss allocation at load-buses give the clear indication about the system reactive power issues, which in-turn give an indication about the system voltage instability/collapse problem.

Item Type:	Conference Paper
Publication:	2018 IEEMA Engineer Infinite Conference, eTechNxT 2018
Publisher:	Institute of Electrical and Electronics Engineers Inc.
Additional Information:	The copyright for this article belongs to the Institute of Electrical and Electronics Engineers Inc.
Keywords:	Electric load flow; Electric power system stability; Electric power transmission networks; Reactive power; Stability; Voltage control, Comparative analysis; Continuation power flow method; Equivalent system; ITS applications; Maximum loadability; modified Y-bus method; Reactive power loss; Reactive power support, Electric load loss
Department/Centre:	Division of Electrical Sciences > Electrical Engineering
Date Deposited:	10 Aug 2022 10:08
Last Modified:	10 Aug 2022 10:08
URI:	https://eprints.iisc.ac.in/id/eprint/75513

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