Verma, AR and Subba Reddy, B and Bandyopadhyay, S (2019) Tracking and Erosion Resistance of Artificially Aged Silicone Rubber Samples. In: 13th International Conference on Industrial and Information Systems, ICIIS 2018, 1 - 2 December 2018, Rupnagar, Punjab, pp. 375-380.
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Abstract
In this paper, experimental investigations are carried out on aged silicone-rubber based polymeric samples. The silicone rubber test specimens are degraded under cyclic application of multiple environmental stresses (thermal, UV, and humidity) for a duration of thousand hours. The samples are evaluated for tracking and erosion resistance as per IEC 60587. The studies are carried out for AC and DC voltages. During the experiments, leakage current is monitored at regular interval of time and waveforms are captured using digital storage oscilloscope and Data acquisition is performed. Fast Fourier Transform (FFT) and standard deviation-multi resolution (STDmRA) analysis using Wavelet Transform is attempted on the leakage current waveforms. The dominated presence of third harmonics is observed causing the thermal degradation and material erosion leading to formation of tracking and erosion resistance.
Item Type: | Conference Paper |
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Publication: | 2018 13th International Conference on Industrial and Information Systems, ICIIS 2018 - Proceedings |
Publisher: | Institute of Electrical and Electronics Engineers Inc. |
Additional Information: | The copyright for this article belongs to Institute of Electrical and Electronics Engineers Inc. |
Keywords: | Binary alloys; Cathode ray oscilloscopes; Data acquisition; Degradation; Digital storage; Elastomers; Erosion; Fast Fourier transforms; Information systems; Information use; Leakage currents; Rubber; Silicones; Uranium alloys; Vanadium alloys; Wavelet transforms, Cyclic applications; Environmental stress; Erosion resistance; Experimental investigations; Material erosion; Multistress; Silicone rubber insulators; Standard deviation, Silicone rubber |
Department/Centre: | Division of Electrical Sciences > High Voltage Engineering (merged with EE) |
Date Deposited: | 08 Aug 2022 04:57 |
Last Modified: | 08 Aug 2022 04:57 |
URI: | https://eprints.iisc.ac.in/id/eprint/75466 |
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