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Potassium-Ion Intercalation Mechanism in Layered Na2Mn3O7

Sada, K and Senthilkumar, B and Barpanda, P (2018) Potassium-Ion Intercalation Mechanism in Layered Na2Mn3O7. In: ACS Applied Energy Materials, 1 (10). pp. 5410-5416.

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Official URL: https://doi.org/10.1021/acsaem.8b01016


Potassium-ion batteries (KIBs) are emerging as promising candidates for large scale applications due to their low cost, elemental abundance, and smaller Stokes radius of K+ relative to Li+ and Na+ ions. However, the large size of K+ ion remains the bottleneck for the development of KIBs. Herein, layered sodium manganese oxide Na2Mn3O7 is demonstrated as a promising intercalation host for K ion for the first time. Prepared by facile one-step solid-state synthesis, Na2Mn3O7 compound crystallized in a triclinic structure (space group P1). An initial discharge capacity of 152 mA h g-1 at a current rate of C/20 was realized with a nominal voltage of 2.1 V vs K/K+. The mechanistic aspects of K+ ion (de)intercalation was investigated using X-ray photoelectron spectroscopy (XPS), ex situ X-ray diffraction (XRD), and potentiostatic intermittent titration technique (PITT). Similar to the Na+-ion insertion, the K+-ion insertion into Na2Mn3O7 involves a two-phase redox mechanism. The layered Na2Mn3O7 forms a potential insertion material for low cost K-ion batteries. C

Item Type: Journal Article
Publication: ACS Applied Energy Materials
Publisher: American Chemical Society
Additional Information: The copyright for this article belongs to the American Chemical Society.
Keywords: Costs; Electric batteries; Ions; Manganese oxide; Pitting; Potassium; X ray photoelectron spectroscopy, capacity; Initial discharge capacities; Intercalation mechanisms; Large-scale applications; Layered oxides; Potassium ions; Potentiostatic intermittent titration techniques; Solid-state synthesis, Sodium compounds
Department/Centre: Division of Chemical Sciences > Materials Research Centre
Date Deposited: 02 Aug 2022 12:23
Last Modified: 02 Aug 2022 12:23
URI: https://eprints.iisc.ac.in/id/eprint/75201

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