FEM based Methods for Uncertainty Quantification in Electromagnetics

Jos, KTG and Vinoy, KJ (2018) FEM based Methods for Uncertainty Quantification in Electromagnetics. In: 2018 IEEE Indian Conference on Antennas and Propagation, InCAP 2018, 16 - 19 December 2018, Hyderabad.

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Abstract

Many electromagnetic problems are subjected to variations in geometry and material properties, which have an impact on the performance. So quantifying these uncertainties helps in performance prediction and optimization in manufacturing of such electromagnetic systems. In addition, a statistical analysis of the response of such stochastic systems provide a better insight for experimental testing and validation. In this paper, the material uncertainty is modelled as a gaussian random process and is discretized using Karhunen Loève expansion. The system response based on finite element modelling is analysed for its impact using perturbation method, intrusive and non-intrusive spectral stochastic finite element method (SSFEM) and stochastic collocation method. The stochastic responses from these methods are validated using Monte Carlo method, and the results indicate that SSFEM is the most computationally efficient approach for this problem.

Item Type:	Conference Paper
Publication:	2018 IEEE Indian Conference on Antennas and Propagation, InCAP 2018
Publisher:	Institute of Electrical and Electronics Engineers Inc.
Additional Information:	The copyright for this article belongs to the Institute of Electrical and Electronics Engineers Inc.
Keywords:	Monte Carlo methods; Perturbation techniques; Random processes; Stochastic models; Stochastic systems, Computationally efficient; Electromagnetic problems; Material uncertainty; Polynomial chaos expansion; Spectral stochastic finite element method; Stochastic collocation method; Stochastic methods; Uncertainty quantifications, Finite element method
Department/Centre:	Division of Electrical Sciences > Electrical Communication Engineering
Date Deposited:	01 Aug 2022 09:20
Last Modified:	01 Aug 2022 09:20
URI:	https://eprints.iisc.ac.in/id/eprint/75111

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