Effect of temperature variation on cold electronics based lc oscillator for rrr measurement

Rangasamy, K and Pankaj, S and Abhay, SG (2017) Effect of temperature variation on cold electronics based lc oscillator for rrr measurement. In: 14th CRYOGENICS IIR International Conference, CRYOGENICS 2017, 15 - 19 May 2017, Dresden, pp. 502-506.

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Abstract

The development and performance analysis of a Cold Electronic LC oscillator is discussed. This is a part of the sensor system being developed for a Residual Resistivity Ratio (RRR) measurement system. In this paper, the effect of temperature variation on cold electronics based LC Oscillator is analysed. This variation in temperature causes oscillator to change its operating frequency. Certain additional harmonics are also introduced into the output waveform at the lower temperatures. This cold electronics based LC oscillator is used as the signal conditioning element for a Residual Resistivity Ratio (RRR) measuring sensor. LabVIEW 11.0 software is used to log the frequency variations for different temperature from 300 K to 4.2 K.

Item Type:	Conference Paper
Publication:	Refrigeration Science and Technology
Publisher:	International Institute of Refrigeration
Additional Information:	The copyright for this article belongs to International Institute of Refrigeration.
Keywords:	Computer programming languages; Cryogenics; IIR filters; Temperature distribution; Thermal logging, Cold electronics; Effect of temperature; Frequency variation; LC-oscillators; Measurement system; Operating frequency; Performance analysis; Residual resistivity ratios, Oscillators (electronic)
Department/Centre:	Division of Physical & Mathematical Sciences > Centre for Cryogenic Technology
Date Deposited:	25 Jul 2022 09:02
Last Modified:	25 Jul 2022 09:02
URI:	https://eprints.iisc.ac.in/id/eprint/74688

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