Manattayil, JK and Krishna, LAS and Kim, H and Raghunathan, V (2022) Focal Field Engineered Infrared-sensitive Third-order Sum Frequency Generation Microscopy. In: Biomedical Spectroscopy, Microscopy, and Imaging II 2022, 9 - 20 May 2022, Virtual, Online.
Full text not available from this repository.Abstract
In this work we present experimental demonstration of focal-field engineering in infrared-sensitive third-order sum frequency generation (TSFG) microscopy by utilizing beam-shaping technique. Two photons of the input mid-infrared (MIR) beam at 3000 nm are upconverted to 615 nm in the presence of a single photon at 1040 nm through the TSFG process. The focal-field engineering scheme studied here improves optical resolution and contrast of the TSFG imaging. We observe best improvement of ~43 in the central-lobe full-width half diameter with ~35 side-lobe strength of that of the central-lobe with the use of optimum phase-mask using isolated amorphous silicon (a-Si) nano disks as the sample. We compare the contrast enhancement between the experiments and simulations as a function of varying grating pitch and find good overall agreement between the two. In addition to annular phase masks, we also demonstrate edge contrast enhancement by imaging gratings with higher-order Hermite-Gaussian beams profile generated using horizontally partitioned 0- phase profile.
| Item Type: | Conference Paper |
|---|---|
| Publication: | Proceedings of SPIE - The International Society for Optical Engineering |
| Publisher: | SPIE |
| Additional Information: | The copyright for this article belongs to the SPIE |
| Keywords: | Gaussian beams; Interferometry; Particle beams; Photons, Focal fields; Hermite Gaussian modes; High order hermite gaussian mode; High-order; Higher-order; Nonlinear microscopy; Sum frequency generation; Super-resolution microscopy; Third order; Third order sum frequency generation microscopy, Amorphous silicon |
| Department/Centre: | Division of Electrical Sciences > Electrical Communication Engineering |
| Date Deposited: | 14 Jul 2022 10:23 |
| Last Modified: | 14 Jul 2022 10:23 |
| URI: | https://eprints.iisc.ac.in/id/eprint/74424 |
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