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Structural and Optical Properties of $CuIn_1-_xAl_xSe_2$ Thin Films Prepared by Four-Source Elemental Evaporation

Dhananjay, * and Nagaraju, J and Krupanidhi, SB (2003) Structural and Optical Properties of $CuIn_1-_xAl_xSe_2$ Thin Films Prepared by Four-Source Elemental Evaporation. In: Solid State Communications, 127 (3). pp. 243-246.


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$CuIn_1-_xAl_xSe_2$ (CIASe) thin films with x = 0.25; 0.5 and 0.65 were prepared by four-source elemental evaporation. The structural and optical properties were investigated by X-ray diffraction, scanning electron microscopy, energy dispersive analysis, and optical transmission. The results showed that these films contain chalcopyrite structure with preferred orientation along (112) direction. The morphology, grain distribution and composition of CIASe films were studied and compared for different Al content. The optical studies revealed that the films were highly absorbing and the energy band gap calculated from transmission spectra for x = 0.25; 0.5 and 0.65 were 1.2, 1.51 and 1.73 eV, respectively. The variation of Al content in the CIASe composition offered a very effective change in the optical band gap.

Item Type: Journal Article
Publication: Solid State Communications
Publisher: Elsevier
Additional Information: Copyright of this article belongs to Elsevier.
Keywords: A.CIASe;B.Four-source elemental evaporation;D.Optical band gap.
Department/Centre: Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics
Division of Chemical Sciences > Materials Research Centre
Date Deposited: 11 Jan 2007
Last Modified: 19 Sep 2010 04:28
URI: http://eprints.iisc.ac.in/id/eprint/7440

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