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Proton Ion Irradiation on As40Se50Sb10 Thin Films: Fluence-Dependent Tuning of Linear-Nonlinear Optical Properties for Photonic Applications

Sahoo, D and Sahoo, S and Alagarasan, D and Ganesan, R and Varadharajaperumal, S and Naik, R (2022) Proton Ion Irradiation on As40Se50Sb10 Thin Films: Fluence-Dependent Tuning of Linear-Nonlinear Optical Properties for Photonic Applications. In: ACS Applied Electronic Materials, 4 (2). pp. 856-868.

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Official URL: https://doi.org/10.1021/acsaelm.1c01223


The present work is focused on the impact of proton irradiation (30 keV) on the structural, optical, and morphological properties of thermally evaporated As40Se50Sb10 thin films. The fluence-induced linear and nonlinear optical parameters were calculated from the transmittance, reflectance, and absorbance data obtained from UV-vis spectroscopy in the range of 550-1100 nm. The increase in transmittance suggests that the material is getting more transparent upon proton irradiation. The change in absorption edge, optical band gap, and refractive index represents the post-irradiation effect. The disorder in the film influenced the density of defect states in the localized state region, which led to the changes in the optical band gap. The variation of dispersion and dielectric parameters such as dispersion energy, oscillator energy, dielectric constant, plasma frequency, and real and imaginary optical conductivities upon proton irradiation displays the tuning capabilities of As40Se50Sb10. The higher values of nonlinear optical parameters with proton irradiation are essential for cutting-edge photonic applications. The X-ray diffraction reveals the amorphous nature of the films after proton irradiation, and the microstructural changes were noticed from the Raman spectra. The composition of the films was verified by energy-dispersive X-ray analysis, and the surface morphology pictures were taken by field emission scanning electron microscopy and atomic force microscopy.

Item Type: Journal Article
Publication: ACS Applied Electronic Materials
Publisher: American Chemical Society
Additional Information: The copyright for this article belongs to the American Chemical Society.
Keywords: Dispersion (waves); Energy dispersive X ray analysis; Energy gap; Field emission microscopes; Ion bombardment; Morphology; Optical band gaps; Optical conductivity; Radiation; Scanning electron microscopy; Scattering parameters; Selenium compounds; Surface morphology; Thin films; Ultraviolet visible spectroscopy; X ray diffraction analysis, Fluences; Ions irradiation; Nonlinear optical parameters; Nonlinear optical properties; Nonlinear refractive index; Optical-; Photonic application; Protons irradiations; Thin-films; Third-order nonlinear susceptibility, Refractive index
Department/Centre: Division of Interdisciplinary Sciences > Centre for Nano Science and Engineering
Division of Physical & Mathematical Sciences > Physics
Date Deposited: 29 Jun 2022 06:40
Last Modified: 29 Jun 2022 06:40
URI: https://eprints.iisc.ac.in/id/eprint/73850

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