Medhi, Biswajit and Hegde, GM and Reddy, KPJ and Roy, D and Vasu, RM (2015) Aberration correction for transport of intensity phase imaging. In: 2015 Workshop on Recent Advances in Photonics, WRAP 2015, 16 - 17 December 2015, Bangalore, pp. 1-4.
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Abstract
Transport of intensity phase imaging suffers from phase aberration due to presence of noise in experimental data and aberration induced by optical system. This induced low frequency aberration corrupts the original phase and makes it difficult to use for any further quantitative processing. In this paper an aberration correction scheme is proposed. A polynomial model is used to represent the low frequency induced aberrations, and further subtracted from the corrupted phase for correcting the phase profile. The proposed scheme is implemented on experimental data obtained from a static microstructure phase object, of 100 nanometer height. The results obtained from the proposed scheme shows a good agreement with the actual known values.
Item Type: | Conference Paper |
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Publisher: | Institute of Electrical and Electronics Engineers Inc. |
Additional Information: | The copyright for this article belongs to the Institute of Electrical and Electronics Engineers Inc. |
Keywords: | DCT; phase; TIE |
Department/Centre: | Division of Mechanical Sciences > Aerospace Engineering(Formerly Aeronautical Engineering) Division of Mechanical Sciences > Civil Engineering Division of Interdisciplinary Sciences > Centre for Nano Science and Engineering Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics |
Date Deposited: | 14 Jun 2022 05:05 |
Last Modified: | 14 Jun 2022 05:05 |
URI: | https://eprints.iisc.ac.in/id/eprint/73425 |
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