Performance of Silicone Rubber Insulators Under Thermal and Electrical Stress

Chakraborty, Rahul and Reddy B, Subba (2017) Performance of Silicone Rubber Insulators Under Thermal and Electrical Stress. In: IEEE Transactions on Industry Applications, 53 (3). pp. 2446-2454. ISSN 0093-9994

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Abstract

In recent times, high temperature vulcanized (HTV) silicone rubber insulators (SIR) are being widely used for overhead high voltage transmission and distribution systems. However, over a period, the insulator surface will be exposed to high temperature in several places, particularly in desert areas; further accumulation of pollutants can alter the temperature distribution along the insulator. In the present work, long-term electrothermal experimentation is carried out on various types of full-scale insulator units. The effect of temperature on pollution performance of SIR insulators is studied, and a novel and simple methodology to achieve uniform contamination layer on inherently hydrophobic HTV SIR insulator samples is presented. A specially fabricated oven having a provision for high voltage connection and facility for measurement of leakage currents is provided. Furthermore, study of migration of low molecular weight, recovery trends of hydrophobicity, and changes in material properties using scanning electron microscopy Fourier transform infrared spectroscopy is carried out.

Item Type:	Journal Article
Publication:	IEEE Transactions on Industry Applications
Publisher:	Institute of Electrical and Electronics Engineers Inc.
Additional Information:	The copyright for this article belongs to the Institute of Electrical and Electronics Engineers Inc.
Keywords:	Contamination layer; Fourier transform infrared (FTIR); high temperature vulcanized (HTV) silicone rubber (SIR); hydrophobicity recovery; long-term electrothermal experimentation; pollution; scanning electron microscopy (SEM)
Department/Centre:	Division of Electrical Sciences > Electrical Engineering
Date Deposited:	13 Jun 2022 12:08
Last Modified:	13 Jun 2022 12:08
URI:	https://eprints.iisc.ac.in/id/eprint/73407

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