Choubey, Peayush and Kreisel, Andreas and Berlijn, T and Andersen, Brian M and Hirschfeld, PJ (2017) Universality of scanning tunneling microscopy in cuprate superconductors. In: Physical Review B, 96 (17). ISSN 2469-9950
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Abstract
We consider the problem of local tunneling into cuprate superconductors, combining model-based calculations for the superconducting order parameter with wave function information obtained from first-principles electronic structure. For some time it has been proposed that scanning tunneling microscopy (STM) spectra do not reflect the properties of the superconducting layer in the CuO2 plane directly beneath the STM tip, but rather a weighted sum of spatially proximate states determined by the details of the tunneling process. These ''filter'' ideas have been countered with the argument that similar conductance patterns have been seen around impurities and charge ordered states in systems with atomically quite different barrier layers. Here we use a recently developed Wannier function-based method to calculate topographies, spectra, conductance maps, and normalized conductance maps close to impurities. We find that it is the local planar Cu dx2-y2 Wannier function, qualitatively similar for many systems, that controls the form of the tunneling spectrum and the spatial patterns near perturbations. We explain how, despite the fact that STM observables depend on the materials-specific details of the tunneling process and setup parameters, there is an overall universality in the qualitative features of conductance spectra. In particular, we discuss why STM results on Bi2Sr2CaCu2O8 (BSCCO) and Ca2-xNaxCuO2Cl2 (NaCCOC) are essentially identical.
| Item Type: | Journal Article |
|---|---|
| Publication: | Physical Review B |
| Publisher: | American Physical Society |
| Additional Information: | The copyright for this article belongs to the Authors. |
| Department/Centre: | Division of Physical & Mathematical Sciences > Physics |
| Date Deposited: | 02 Jun 2022 06:21 |
| Last Modified: | 02 Jun 2022 06:21 |
| URI: | https://eprints.iisc.ac.in/id/eprint/73074 |
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