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A High-Quality Entropy Source Using van der Waals Heterojunction for True Random Number Generation

Abraham, Nithin and Watanabe, Kenji and Taniguchi, Takashi and Majumdar, Kausik (2022) A High-Quality Entropy Source Using van der Waals Heterojunction for True Random Number Generation. In: ACS Nano, 16 (4). pp. 5898-5908. ISSN 1936-0851

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Official URL: https://doi.org/10.1021/acsnano.1c11084


Generators of random sequences used in high-end applications such as cryptography rely on entropy sources for their indeterminism. Physical processes governed by the laws of quantum mechanics are excellent sources of entropy available in nature. However, extracting enough entropy from such systems for generating truly random sequences is challenging while maintaining the feasibility of the extraction procedure for real-world applications. Here, we present a compact and an all-electronic van der Waals heterostructure-based device capable of detecting discrete charge fluctuations for extracting entropy from physical processes and use it for the generation of independent and identically distributed true random sequences. We extract a record-high value (>0.98 bits/bit) of min-entropy using the proposed scheme. We demonstrate an entropy generation rate tunable over multiple orders of magnitude and show the persistence of the underlying physical process for temperatures ranging from cryogenic to ambient conditions. We verify the random nature of the generated sequences using tests such as NIST SP 800-90B standard and other statistical measures and verify the suitability of our random sequence for cryptographic applications using the NIST SP 800-22 standard. The generated random sequences are then used in implementing various randomized algorithms without any preconditioning steps.

Item Type: Journal Article
Publication: ACS Nano
Publisher: American Chemical Society
Additional Information: The copyright of this article belongs to the Authors.
Keywords: artificial electron trap; cryptography; entropy source; hardware security; true random number generator; tunnel junction; van der Waals heterostructure
Department/Centre: Division of Electrical Sciences > Electrical Communication Engineering
Date Deposited: 24 May 2022 11:30
Last Modified: 24 May 2022 11:30
URI: https://eprints.iisc.ac.in/id/eprint/72353

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