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Impulse Breakdown Characteristics and Cost/Benefit Analysis of $SF_6/CCL_2F_2/C0_2$ Mixtures

Raghavender, D and Naidu, MS (1989) Impulse Breakdown Characteristics and Cost/Benefit Analysis of $SF_6/CCL_2F_2/C0_2$ Mixtures. In: Conference on Electrical Insulation and Dielectric Phenomena, 1989. Annual Report, 29th October-2nd November, Leesburg,VA, pp. 489-494.


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A comprehensive study has been carried out in $SF_6/CCL_2F_2/C0_2$ mixtures to measure 50% breakdown voltages $(V_5_0)$ using both positive and negative polarity lightning impulse (1.2/50 $\mu$s) voltages under non-uniform fields (5 mm. rod – 230 mm plane electrode) over a pressure range of 0.1 to 0.5 HPa for a gap spacing of 20 mm. The sum of $SF_6$,and $CCL_2F_2$ concentrations in the mixture was always maintained in the range of 21 to 40%, rest being $CO_2$. Among the different sets of $SF_6/CCL_2F_2/CO_2$ mixtures studied, two ternary mixtures, namely 20% $SF_6/20% CCL_2F_2/60% CO2$ and 30% $SF_6/10% CCL_2F_2/60% CO_2$ are found superior to $SF_6$. From the known gas content in the mixtures and from the measured breakdown voltages a cost/benefit analysis has been carried out for the various mixtures investigated. A striking feature of this analysis is that the most promising ternary gas mixture, namely, 30% $SF_6/10% CCL_2F_2/60% CO_2$, costs only 33% of the cost of pure $SF_6$, giving 110% to 130% positive breakdown strength, and 90 to 100% negative breakdown strength as compared to that of pure $SF_6$.

Item Type: Conference Paper
Publisher: IEEE
Additional Information: Copyright 1990 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Department/Centre: Division of Electrical Sciences > High Voltage Engineering (merged with EE)
Date Deposited: 01 Feb 2007
Last Modified: 19 Sep 2010 04:27
URI: http://eprints.iisc.ac.in/id/eprint/7061

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