Meghanani, A and C S, A and Ramakrishnan, AG (2021) An Exploration of Log-Mel Spectrogram and MFCC Features for Alzheimer's Dementia Recognition from Spontaneous Speech. In: 2021 IEEE Spoken Language Technology Workshop, SLT 2021, 19-22 Jan 2021, Shenzhen, China, pp. 670-677.
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Abstract
In this work, we explore the effectiveness of log-Mel spectrogram and MFCC features for Alzheimer's dementia (AD) recognition on ADReSS challenge dataset. We use three different deep neural networks (DNN) for AD recognition and mini-mental state examination (MMSE) score prediction: (i) convolutional neural network followed by a long-short term memory network (CNN-LSTM), (ii) pre-trained ResNet18 network followed by LSTM (ResNet-LSTM), and (iii) pyramidal bidirectional LSTM followed by a CNN (pBLSTM-CNN). CNN-LSTM achieves an accuracy of 64.58 with MFCC features and ResNet-LSTM achieves an accuracy of 62.5 using log-Mel spectrograms. pBLSTM-CNN and ResNet-LSTM models achieve root mean square errors (RMSE) of 5.9 and 5.98 in the MMSE score prediction, using the log-Mel spectrograms. Our results beat the baseline accuracy (62.5) and RMSE (6.14) reported for acoustic features on ADReSS challenge dataset. The results suggest that log-Mel spectrograms and MFCCs are effective features for AD recognition problem when used with DNN models. © 2021 IEEE.
Item Type: | Conference Proceedings |
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Publication: | 2021 IEEE Spoken Language Technology Workshop, SLT 2021 - Proceedings |
Publisher: | Institute of Electrical and Electronics Engineers Inc. |
Additional Information: | The copyright for this article belongs to Institute of Electrical and Electronics Engineers Inc. |
Keywords: | Convolutional neural networks; Deep neural networks; Mean square error; Neurodegenerative diseases; Spectrographs; Speech recognition, Acoustic features; Alzheimer's dementia; Baseline accuracy; Mini-mental state examinations; Root mean square errors; Short term memory; Spectrograms; Spontaneous speech, Long short-term memory |
Department/Centre: | Division of Electrical Sciences > Electrical Engineering |
Date Deposited: | 13 Jul 2021 08:49 |
Last Modified: | 13 Jul 2021 08:49 |
URI: | http://eprints.iisc.ac.in/id/eprint/68815 |
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