Switching of linear and nonlinear optical parameters in As35Se65 thin films upon annealing at both above and below T g

Priyadarshini, P and Sahoo, D and Aparimita, A and Alagarasan, D and Ganesan, R and Varadharajaperumal, S and Naik, R (2020) Switching of linear and nonlinear optical parameters in As35Se65 thin films upon annealing at both above and below T g. In: Applied Physics A: Materials Science and Processing, 126 (11).

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Abstract

The present manuscript investigated the effect of thermal annealing at 150 °C (below Tg) and 250 °C (above Tg) on the nonlinear as well as linear optical parameters and structural changes of the thermally evaporated As35Se65 thin films. The structural investigation was done by X-ray diffraction, Raman spectroscopy, X-ray photoelectron spectroscopy, whereas the surface morphology was studied by field emission scanning electron microscopy. The optical transmission and reflection spectra over the wavelength range 500–1200 nm were used to calculate the optical parameters. The optical energy gap, Urbach energy, optical density, skin depth, Tauc parameters for the as-deposited and annealed As35Se65 films were estimated and discussed in terms of density of defect states and disorders. The indirect optical energy gap decreased for 150 °C annealed film and abruptly increased for 250 °C annealed film as compared with the as-prepared film. The Swanepoel envelope method, WDD model, and Sellemeire postulates were employed for analysis of refractive index, static refractive index, dispersion energy, oscillator wavelength, oscillator energy, and dielectric constant. The non-linear refractive index and third-order susceptibility were also estimated with the help of empirical relations which showed opposite changes for the two annealing temperatures. The tunable optical properties can be applied for several optoelectronic application. © 2020, Springer-Verlag GmbH Germany, part of Springer Nature.

Item Type:	Journal Article
Publication:	Applied Physics A: Materials Science and Processing
Publisher:	Springer Science and Business Media Deutschland GmbH
Additional Information:	The copyright of this article belongs to Springer Science and Business Media Deutschland GmbH
Keywords:	Annealing; Arsenic compounds; Energy gap; Field emission microscopes; Light transmission; Morphology; Optical variables control; Refractive index; Scanning electron microscopy; Selenium compounds; Surface morphology; Thin films; X ray photoelectron spectroscopy, Annealing temperatures; Dispersion energies; Field emission scanning electron microscopy; Nonlinear optical parameters; Optoelectronic applications; Structural investigation; Third-order susceptibility; Tunable optical properties, Nonlinear optics
Department/Centre:	Division of Interdisciplinary Sciences > Centre for Nano Science and Engineering Division of Physical & Mathematical Sciences > Physics
Date Deposited:	21 Jan 2021 09:40
Last Modified:	15 Dec 2023 11:00
URI:	https://eprints.iisc.ac.in/id/eprint/67339

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