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CZTS solar cell with non-toxic buffer layer: A study on the sulphurization temperature and absorber layer thickness

Prabeesh, P and Sajeesh, VG and Packia Selvam, I and Divya Bharati, MS and Mohan Rao, G and Potty, SN (2020) CZTS solar cell with non-toxic buffer layer: A study on the sulphurization temperature and absorber layer thickness. In: Solar Energy, 207 . pp. 419-427.

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Official URL: https://dx.doi.org/10.1016/j.solener.2020.06.103


Cu2ZnSnS4 solar cell has been fabricated with a non-toxic buffer layer and Al doped ZnO transparent conducting layer. A detailed material study on each layer of the solar cell has been carried out independently. The precursor films prepared by spin coating were sulphurized at different temperatures to optimize the conditions to obtain phase pure CZTS films. X-ray diffraction, Raman spectroscopy and rietveld refinement studies confirmed the phase purity of the film sulphurized at 500 °C. The optimum CZTS properties like band gap of 1.45 eV, high absorption coefficient ~2 � 105 cm�1 and dense surface morphology were obtained for films sulphurized at 500 °C. Carrier concentration, mobility and resistivity of these films were ~1 � 1019 cm�3, 0.23 cm2 V�1 s�1 and 2.7 Ωcm, respectively. The efficiency measurements of the cells with device structure SLG/Mo/CZTS/ZnS/AZO/Ag were carried out using absorber films with three different thicknesses. The optimized CZTS absorber layer with thickness of ~1.8 µm exhibited solar cell conversion efficiency of 3.02 for an active area of 0.21 cm2 with open-circuit voltage of 0.38 V, short-circuit current density of 17.19 mA/cm2 and fill factor of 46. © 2020 International Solar Energy Society

Item Type: Journal Article
Publication: Solar Energy
Publisher: Elsevier Ltd
Additional Information: Copy right for this article belongs to Elsevier Ltd
Keywords: CZTSSpin coatingSolar cellZnS bufferRietveld refinement
Department/Centre: Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics
Date Deposited: 20 Nov 2020 10:35
Last Modified: 20 Nov 2020 10:35
URI: http://eprints.iisc.ac.in/id/eprint/66088

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