Tomy, GJK and Vinoy, KJ (2020) Neumann-Expansion-Based FEM for Uncertainty Quantification of Permittivity Variations. In: IEEE Antennas and Wireless Propagation Letters, 19 (4). pp. 561-565.
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Abstract
Electromagnetic analysis is subjected to uncertainties due to variations in material properties, excitation functions, boundary conditions, or the geometry itself. In this letter, the stochastic response is obtained using the Neumann expansion method, which is implemented alongside Galerkin's formulation of vector finite elements for the variations in the properties of the electromagnetic material. Using the proposed approach, a constraint on the maximum allowed variations in permittivity is estimated. The Neumann expansion with a third-order approximation passes the Kolmogorov-Smirnov test resulting in output response matching with that of the Monte Carlo method. Since accurate stochastic simulations are possible within less computational time, we extend the analysis to the full operating frequency range with this method. It has also been shown that the computational complexity of the Neumann expansion method does not scale with number of stochastic regions considered. © 2002-2011 IEEE.
Item Type: | Journal Article |
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Publication: | IEEE Antennas and Wireless Propagation Letters |
Publisher: | Institute of Electrical and Electronics Engineers Inc. |
Additional Information: | Copyright for this article belongs to Institute of Electrical and Electronics Engineers Inc. |
Keywords: | Computational complexity; Electric excitation; Finite element method; Magnetic materials; Permittivity; Stochastic models; Stochastic systems; Uncertainty analysis, Electromagnetic analysis; Electromagnetic materials; Kolmogorov-Smirnov test; Stochastic response; Stochastic simulations; Third order approximations; Uncertainty quantifications; Vector finite element, Monte Carlo methods |
Department/Centre: | Division of Electrical Sciences > Electrical Communication Engineering |
Date Deposited: | 08 Apr 2021 10:07 |
Last Modified: | 08 Apr 2021 10:07 |
URI: | http://eprints.iisc.ac.in/id/eprint/65356 |
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